6 results
ZEISS ORION NanoFab: New SIMS Spectrometer
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 526-527
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- August 2019
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Distinguishing Isotopes in the Electron Microscope: In-situ TEM-SIMS Correlative Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 222-223
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- July 2016
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SIMS on the Helium Ion Microscope: a Powerful Tool for High-Resolution High-Sensitivity Nano-Analytics
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 160-161
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- July 2016
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Towards a High-Brightness Electron Impact Ion Source for Nano-Applications
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S4 / June 2015
- Published online by Cambridge University Press:
- 28 September 2015, pp. 94-99
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- June 2015
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Correlative Microscopy Using TEM and SIMS: Parallel Ion Electron Spectrometry (PIES) for High-Resolution, High-Sensitivity Elemental Mapping for Applications in Materials Science and Biology
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 970-971
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- August 2014
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